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Effect of Transition Metal Impurities on the Defects in 4H-SiC: Insights from EBIC/CL Characterization

陳 斌, 関口 隆史, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura.
2013 JSAP-MRS. 2013.

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      Created at: 2017-02-14 11:18:51 +0900Updated at: 2017-07-10 21:43:18 +0900

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