HOME > 口頭発表 > 書誌詳細Effect of Transition Metal Impurities on the Defects in 4H-SiC: Insights from EBIC/CL Characterization 陳 斌, 関口 隆史, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura. 2013 JSAP-MRS. 2013.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-14 11:18:51 +0900更新時刻: 2017-07-10 21:43:18 +0900
