HOME > Presentation > Detail(Mott Insulating State of Ultrathin Epitaxial LaNiO3 Thin Films Detected by Hard X-ray Photoemission)A. X. Gray, A. Janotti, J. Son, J. M. LeBeau, 上田 茂典, 山下 良之, 小林 啓介, A. M. Kaiser, R. Sutarto, H. Wadati, G. A. Sawatzky, S. Stemmer, C. S. Fadley. HAXPES 2011. 2011.NIMS author(s)UEDA, ShigenoriYAMASHITA, YoshiyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:03:17 +0900Updated at: 2017-07-10 21:07:56 +0900