HOME > Presentation > Detail走査透過電子顕微鏡法(STEM)入門(Brief Introduction to Scanning Transmission Electron Microscopy (STEM))木本 浩司, 吉川 純, コレツ オヴィヂュ, 柳澤 圭一, 石塚 和夫. 日本顕微鏡学会第63回シンポジウム. November 20, 2020-November 21, 2020. InvitedNIMS author(s)KIMOTO, KojiKIKKAWA, JunCRETU, OvidiuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-12-10 03:00:22 +0900 Updated at: 2024-03-05 12:21:32 +0900