HOME > Presentation > Detail
(Evidence of defect passivation in amorphous In-Ga-Zn-O obtained by hard X-ray photoemission spectroscopy)
STAC8. June 25, 2014-June 27, 2014.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:52:20 +0900Updated at: 2017-07-10 21:53:33 +0900