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X線回折における異常散乱現象を用いたZnO薄膜の極性判定
(Polarity determination of ZnO films by x-ray diffraction using anomalous dispersion)
応用物理学会2009年秋季第70回学術講演会. September 08, 2009-September 11, 2009.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:59:06 +0900Updated at: 2017-07-10 20:34:11 +0900