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Atom Probe and Cathodoluminescence study of Mg implanted layers in GaN
DRIP XVII (Defects-Recognition, Imaging and Physics in Semicondu. 2017.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-07-08 23:16:58 +0900Updated at: 2018-06-05 14:10:37 +0900