HOME > Presentation > Detailμμdiffを用いた歪精密測定(Strain measurement using μμdiffraction on F200)上杉 文彦, 根本 善弘, 竹口 雅樹. 公益社団法人日本顕微鏡学会第76回学術講演会. May 25, 2020-May 27, 2020.NIMS author(s)UESUGI, FumihikoNEMOTO, YoshihiroTAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-10-27 03:00:18 +0900 Updated at: 2020-10-27 03:00:18 +0900