HOME > Presentation > DetailSynchrotron Soft X-ray Scanning Photoelectron Microscopy Analysis of Gate-controlled Photo-oxidation in Graphene Field-effect TransistorsNAGAMURA, Naoka, Masato Kotsugi, Masaharu Oshima, Ryo Nouchi. 2023 Taiwan-Japan Symposium on Reaction Control (2023 TJSReC). July 28, 2023-July 29, 2023.NIMS author(s)NAGAMURA, NaokaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2024-01-09 03:09:44 +0900Updated at: 2024-01-09 03:09:44 +0900