HOME > Presentation > DetailElectronic state analysis of photocatalytic micro-particles using scanning photoelectron microscopy(走査型光電子顕微鏡分光による光触媒微粒子の電子状態解析)OISHI, Kenta, 張文雄, 久富隆史, 堂免一成, 小嗣真人, NAGAMURA, Naoka. THE 22ND INTERNATIONAL VACUUM CONGRESS(IVC-22). September 11, 2022-September 16, 2022.NIMS author(s)NAGAMURA, NaokaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2023-01-17 03:34:02 +0900Updated at: 2023-01-17 03:34:02 +0900