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Si(111)基板上AlxGa1-xN薄膜の硬X線光電子分光
(Hard x-ray photoelectron spectroscopy for AlGaN film grown on Si (111) substrate by MOCVD)
2009年春季 第56回応用物理学関係連合講演会. 2009.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:23:30 +0900Updated at: 2017-07-10 20:27:38 +0900