HOME > Presentation > Detail緻密質SnO2セラミックス中の添加ZnのSIMSイメージングと深さ方向測定(SIMS imaging and depth profiling of implanted zinc in the dense SnO2 ceramics)橋口 未奈子, 坂口 勲, 坂本直哉, 圦本尚義, 菱田 俊一, 大橋 直樹. STAC-7. June 19, 2013-June 21, 2013.NIMS author(s)SAKAGUCHI, IsaoOHASHI, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:50:50 +0900 Updated at: 2018-06-05 13:21:54 +0900