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Electronic state analysis of graphene edges using scanning photoelectron microscopy under gate-controlled ultraviolet oxidization

NAGAMURA, Naoka, 今野隼, 松本守広, 小嗣真人, 尾嶋正治, 野内亮.
THE 22ND INTERNATIONAL VACUUM CONGRESS(IVC-22). September 11, 2022-September 16, 2022.

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    Created at: 2022-11-23 03:26:47 +0900Updated at: 2022-11-23 03:26:47 +0900

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