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Si/SiO2界面の酸化を表現する電荷移動型原子間ポテンシャル
(Charge-transfer interatomic potential for oxidation simulation of Si/SiO2 interface)

高本聡, 山崎 隆浩, 大野 隆央, 金田千穂子, 泉聡志, 酒井信介.
計算力学講演会. 2015.

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    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2017-02-14 11:45:05 +0900Updated at: 2017-07-10 22:18:48 +0900

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