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Si/SiO2界面の酸化を表現する電荷移動型原子間ポテンシャル
(Charge-transfer interatomic potential for oxidation simulation of Si/SiO2 interface)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:45:05 +0900Updated at: 2017-07-10 22:18:48 +0900