HOME > Presentation > DetailAutomatic Estimation of XPS Reference Spectra for TiO2 Semiconductor Free from Equipment-derived Arbitrariness村上 諒, 永田 賢二, 吉川 英樹, 篠塚 寛志, 庄野 逸. Material Research Meeting 2021 (MRM2021). December 13, 2021-December 17, 2021.NIMS author(s)NAGATA, KenjiYOSHIKAWA, HidekiSHINOTSUKA, HiroshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2021-12-23 15:44:56 +0900Updated at: 2021-12-23 15:44:56 +0900