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(High-Pressure Raman Study of Al14N and Al15N Epitaxial Thin Films on Sapphire Substrates)

ICC3. November 14, 2010-November 18, 2010.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-01-08 03:41:38 +0900 Updated at: 2017-07-10 20:54:38 +0900

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