Hard X-ray photoemission study of the temperature induced valence transition system EuNi2(Si1-xGex)2

K. Ichiki, K. Mimura, H. Anzai, T. Uozumi, E. Matsuyama, H. Sato, Y. Utsumi, 上田茂典, A. Mitsuda, H. Wada, Y. Taguchi, K. Shimada, H. Namatame, M. Taniguchi.

International Conference on Strongly Correlated Electron Systems. July 07, 2014-July 11, 2014.