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硬X線光電子分光法によるa-Si/BaSi2のバンドアライメント測定
(Measurement of band alignment at a-Si/BaSi2 interfaces using hard x-ray photoemission spectroscopy)
第63回応用物理学会春季学術講演会. March 19, 2016-March 22, 2016.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:21:05 +0900Updated at: 2017-07-10 22:22:58 +0900