HOME > Presentation > DetailOxide interface characterization of n/p-GaN for power electronicsKOIDE, Yasuo, IROKAWA, Yoshihiro, NABATAME, Toshihide, MITSUISHI, Kazutaka. 66th Electronic Materials Conference (EMC) 2024. June 26, 2024-June 28, 2024.NIMS author(s)KOIDE, YasuoIROKAWA, YoshihiroNABATAME, ToshihideMITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2024-08-08 03:13:48 +0900Updated at: 2024-08-08 03:13:48 +0900