HOME > 口頭発表 > 書誌詳細Low energy secondary electron imaging of pn junctions in Si and GaN using fountain detector揚村 寿英, 岩井 秀夫, 関口 隆史. Microscopy of Semiconducting Materials (MSM-XX). 2017.NIMS著者岩井 秀夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-07-08 23:16:56 +0900更新時刻: 2018-06-05 14:10:34 +0900