HOME > Presentation > Detail
SEM, EBSD and EBIC characterizations of epitaxial β-FeSi2 thin films on Si substrate
2011 Tsukuba Nanotechnology Symposium. 2011.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:03:44 +0900Updated at: 2017-07-10 21:15:24 +0900