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Gate-modulated reflectance spectroscopy for detecting excitonic states in two-dimensional semiconductors

APS March Meeting 2024. March 03, 2024-March 08, 2024.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2024-03-30 03:12:19 +0900Updated at: 2024-03-30 03:12:19 +0900

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