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走査SQUID顕微鏡による薄膜中の欠陥、電流、量子化磁束の同時評価
(Simultaneous Characterization of Defects, Quantized Magnetic Flux and Current Flows in Oxide Superconducting Thin Films. )
E-MRS 2013 Spring Meeting. 2013.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 05:04:18 +0900Updated at: 2017-07-10 21:32:38 +0900