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(Oxygen migration at Pt or Cu/HfO2 interface under bias operation: oxide based ReRAM application)
2011 Materials Research Society Spring Meeting and Exhibit. 2011.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:00:26 +0900Updated at: 2017-07-10 21:03:54 +0900