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Lattice-plane orientation mapping of 2-inch homo-epitaxial GaN (0001) thin films by grazing incident x-ray diffraction topography
JSAP Autumn Meeting 2018. September 18, 2018-September 21, 2018.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-09-08 16:16:25 +0900 Updated at: 2018-09-08 16:16:25 +0900