HOME > Presentation > DetailFully automatic peak and background analysis of XPS spectral data -- Sparse modeling of XPS spectraSHINOTSUKA, Hiroshi, YOSHIKAWA, Hideki, 村上 諒, 仲村 和貴, 田中 博美, 吉原 一紘. NIMS WEEK 2019. October 28, 2019-November 01, 2019.NIMS author(s)SHINOTSUKA, HiroshiYOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-07-10 03:00:17 +0900Updated at: 2020-07-10 03:00:17 +0900