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ベイズ推定による酸化シリコン表面のSi 2p XPS解析
(Bayesian Estimation for Analyzing Si 2p XPS of Oxidized Silicon Surfaces)
2025年第72回応用物理学会春季学術講演会. March 14, 2025-March 17, 2025.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2025-07-15 03:08:20 +0900 Updated at: 2025-07-15 03:08:20 +0900