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(Vacancy-type defects in InGaN grown by metal organic chemical vapor deposition probed using a monoenergetic positron beam)

上殿明良, T. Tsutusi, T. Watanabe, S. Kimura, Y. Zhang, ロザック ミカエル, サン リウエン, S. Ishibashi, 角谷 正友.
55th Electronic Materials. 2013.

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    Created at: 2017-02-14 11:09:44 +0900Updated at: 2017-07-10 21:49:10 +0900

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