HOME > Presentation > Detail(Vacancy-type defects in InGaN grown by metal organic chemical vapor deposition probed using a monoenergetic positron beam)上殿明良, T. Tsutusi, T. Watanabe, S. Kimura, Y. Zhang, ロザック ミカエル, サン リウエン, S. Ishibashi, 角谷 正友. 55th Electronic Materials. 2013.NIMS author(s)SANG, LiwenSUMIYA, MasatomoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:09:44 +0900Updated at: 2017-07-10 21:49:10 +0900