Effect of deep-defects on the energy dissipation of diamond MEMS resonator

サンフアンイン, SANG, Liwen, KOIDE, Yasuo, KOIZUMI, Satoshi, LIAO, Meiyong.

19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XIX) https://confit.atlas.jp/guide/event/drip19/top. August 29, 2022-September 01, 2022.

NIMS author(s)

KOIZUMI, Satoshi
LIAO, Meiyong

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-09-23 03:19:43 +0900 Updated at: 2022-09-23 03:19:43 +0900