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Characterization of xenon nanoprecipitates embedded in aluminium crystals by means of 3-D TEM
The 9th asia-pacific Microscopy Conference (APMC9). November 02, 2008-November 07, 2008.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 12:06:19 +0900 Updated at: 2022-09-05 12:06:19 +0900