HOME > Presentation > Detail(Thickness Identification and Electronic Transport in Atomically Thin MoS2 Layers)黎 松林, 塚越 一仁. TNTJapan2014 International Conference. January 29, 2014-January 31, 2014.NIMS author(s)TSUKAGOSHI, KazuhitoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:51:07 +0900Updated at: 2018-06-05 13:31:08 +0900