SAMURAI - NIMS Researchers Database

HOME > Presentation > Detail

Characterization of β-Ga2O3 and mosaic Diamond wafers by using EBSD and FIB/STEM technics

Author(s)Koji TANAKA, Shinya OHMAGARI, Hitoshi UMEZAWA, Hideyuki WATANABE, TACHIKI, Minoru, Miwako TAKANO, Hideaki YAMADA, Akiyoshi CHAYAHARA.
Event name12th Asia-Pacific Microscopy Conference (APMC-2020)
Year of publication2020
LanguageEnglish

▲ Go to the top of this page