HOME > Presentation > Detail
Characterization of β-Ga2O3 and mosaic Diamond wafers by using EBSD and FIB/STEM technics
12th Asia-Pacific Microscopy Conference (APMC-2020). 2020.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2021-05-03 03:00:17 +0900Updated at: 2021-05-03 03:00:17 +0900