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(Atomistic Behavior of Nitrogen Atoms in Hf-based High-k Gate Dielectrics: First-principles Study)
Seminar. 2005.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-25 01:00:54 +0900Updated at: 2017-07-10 19:24:52 +0900