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Synchrotron Soft X-ray Scanning Photoelectron Microscopy Analysis of Gate-controlled Photo-oxidation in Graphene Field-effect Transistors

NAGAMURA, Naoka, Shun Konno, Morihiro Matsumoto, Wenxiong Zhang, Masato Kotsugi, Masaharu Oshima, Koji Horiba, Ryo Nouchi.
MRM2023/IUMRS-ICA2023 Grand Meeting. December 11, 2023-December 16, 2023.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2024-08-23 03:14:19 +0900Updated at: 2024-08-23 03:14:19 +0900

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