HOME > Presentation > DetailNanoscale Electrical Transport Measurement by Multiple-Scanning-Probe Microscopes久保 理, 新ヶ谷 義隆, 青野 正和, 中山 知信. MANA International Symposium 2009. 2009. InvitedNIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuNAKAYAMA, TomonobuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:48:37 +0900Updated at: 2024-03-05 11:42:20 +0900