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Investigation on the trap states at p-GaN MO(I)S interface with different gate dielectric layers

SANG, Liwen, 任 兵, LIAO, Meiyong, KOIDE, Yasuo, SUMIYA, Masatomo.
応用物理学会. 2018.

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Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2019-03-04 09:35:44 +0900Updated at: 2019-03-04 09:35:44 +0900

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