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Investigation on the trap states at p-GaN MO(I)S interface with different gate dielectric layers
応用物理学会. September 18, 2018-September 21, 2018.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2019-03-04 09:35:44 +0900 Updated at: 2019-03-04 09:35:44 +0900