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X線光電子分光法によるシリコン酸化物系薄膜負極のオペランド反応解析
(Electrochemical Lithiation/Delithiation of a SiOx Thin-Film Electrode using Operando X-ray Photoelectron Spectroscopy)
2025電気化学秋季大会. September 04, 2025-September 05, 2025.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2025-12-17 03:14:21 +0900 Updated at: 2025-12-17 03:14:21 +0900