HOME > Presentation > DetailCathodoluminescence properties of pn junctions in GaN using oblique cutting methodsジョ ユージン, 姚 遠昭, 羅 顕佳, 木村 隆, 関口 隆史. Defects-Recognition, Imaging and Physics in Semiconductors. 2017.NIMS author(s)CHO, YujinKIMURA, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-09-29 22:30:10 +0900Updated at: 2018-06-05 14:13:35 +0900