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非c軸配向Bi系超伝導体の走査SQUID顕微鏡による評価
(Characterization of non c-axis Oriented Bi-based Superconducting Thin Films by Scanning SQUID Microscopy)
日本MRS年次大会. 2017.
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Created at: 2017-09-12 22:23:08 +0900Updated at: 2018-06-05 14:12:48 +0900