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Synchrotron X-ray characterization of MgxNi1-xO epitaxial thin films
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-09-08 22:24:02 +0900Updated at: 2018-06-05 14:12:38 +0900
HOME > Presentation > Detail