HOME > Presentation > Detail(SIMS application for quantitative analysis of trace elements and their distribution in materials)羽田 肇, 伊東 純一, 大橋 直樹, 坂口 勲, 菱田 俊一, 齋藤 紀子. 沖永良部コンファレンス. May 20, 2005-May 21, 2005. InvitedNIMS author(s)HANEDA, HajimeOHASHI, NaokiSAKAGUCHI, IsaoHISHITA, ShunichiSAITO, NorikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-25 00:56:03 +0900Updated at: 2024-03-05 11:40:38 +0900