HOME > Presentation > DetailInterface states governed photoelectrical properties of diamond deep-ultraviolet detector廖 梅勇, サン リウエン, 井村 将隆, 小出 康夫. The 29th International Conference on Defects in Semiconductors. 2017.NIMS author(s)LIAO, MeiyongSANG, LiwenIMURA, MasatakaKOIDE, YasuoFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-06-09 22:36:57 +0900 Updated at :2018-06-05 14:09:34 +0900