HOME > Presentation > DetailInterface melting in the Si/Al interface observed by TOF-SIMS(TOF-SIMSによるSi/Al界面における界面融解)WATANABE, Norimichi, MAMIYA, Hiroaki, FUJITA, Daisuke, KITAZAWA, Hideaki. SIP-IMASM 2017. 2017.NIMS author(s)MAMIYA, HiroakiFUJITA, DaisukeKITAZAWA, HideakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-10-11 23:03:16 +0900Updated at: 2018-06-05 14:13:58 +0900