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硬X線光電子分光法を用いたMgドープInNの表面&バルク電子状態評価
(Surface and Bulk Electronic Structure of Mg-doped InN Analyzed by Hard X-ray Photoelectron Spectroscopy )
International Workshop on Nitride Semiconductors 2012. 2012.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:38:52 +0900Updated at: 2018-06-05 13:10:58 +0900