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Observation of interface melting in the Si/ Al interface by TOF-SIMS
(TOF-SIMSによるSi/Al界面における界面融解現象の観測)

KITAZAWA, Hideaki, WATANABE, Norimichi, SZABELEWSKI, Jakub, Jakub Szabelewsk, MAMIYA, Hiroaki, FUJITA, Daisuke.
ISSS-8. 2017.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-12-06 22:01:11 +0900Updated at: 2018-06-05 14:14:00 +0900

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