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Application of transition-edge sensor type microcalorimeter x-ray detector for compositional analysis in scanning electron microscopy
12th International Symposium on Atomic Level Characterizations for New Materials and Devices '19. October 20, 2019-October 25, 2019. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2020-03-24 03:00:27 +0900 Updated at: 2024-03-05 12:21:26 +0900