HOME > Presentation > Detail(Angle-resolved analysis of surface band bending in InxGa1-xN films by hard X-ray photoemission spectroscopy)角谷 正友, ロザック ミカエル, 上田 茂典, S. Liu, 吉川 英樹, B. Shen, X. Wang, サン リウエン. LEDIA '13. 2013.NIMS author(s)SUMIYA, MasatomoUEDA, ShigenoriYOSHIKAWA, HidekiSANG, LiwenFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-02-26 20:48:48 +0900 Updated at :2018-06-05 13:30:55 +0900