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Probe-EBIC法によるSi基板上BaSi2薄膜の少数キャリア拡散長評価
(Minority carrier diffusion in BaSi2 thin films studied by probe-EBIC technique)
日本顕微鏡学会 第70回学術講演会. 2014.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:44:31 +0900Updated at: 2018-06-05 13:31:52 +0900