HOME > 口頭発表 > 書誌詳細Evaluation of Structural Disorder and In-Gap States of III-V nitrides by Photothermal Deflection Spectroscopy角谷 正友. 7th International symposium of nitride semiconductors. 2018. 招待講演NIMS著者角谷 正友Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-08-30 16:22:57 +0900更新時刻: 2024-03-05 12:20:45 +0900