HOME > Presentation > Detail
Accurate Measurement of the Lattice Constant Deviation at Thin Film Interface by diffraction mapping
the 74rd Annual Meeting of The Japanese Society of Microscopy. 2018.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-06-13 08:25:54 +0900Updated at: 2018-06-13 08:25:54 +0900